High-Temperature Operating Life

High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage, and dynamic operation for a predefined period of time.

Temperature Humidity bias (standard 85/85)  

Some product failures are caused by moisture. It infiltrates into product along IC enclosure seals or gaps between pins which conducts metals within IC and results in short circuit or current leak. The Temperature and Humidity test is designed to test resistance of IC enclosures against moisture to assure product reliability.